报告题目：Exploring materials properties using advanced AFM techniques: from ferroelectricity to electrochemistry
报告人：Prof. Yunseok Kim, School of Advanced Materials Science and Engineering, Sungkyunkwan University
Atomic force microscope (AFM) has become a quintessential tool for exploring nanoscale material properties. Specifically the last few years have witnessed a revolution of the capabilities offered by AFM to explore local physical phenomena at the nanoscale. In this presentation, I will present how material properties can be measured using AFM and, furthermore, summarize our recent effort on the development of the AFM techniques and application of advanced AFM techniques for exploring various local physical phenomena, e.g. piezoelectricity in 2D MoTe2, ferroelectricity in CH3NH3PbX, BiFeO3 and HfO2, and electrochemistry in carbon and advanced high strength steels. In addition, I will briefly discuss how we were able to tune material properties through point defect engineering.
Dr. Yunseok Kim is currently an associate professor at School of Advanced Materials Science and Engineering, Sungkyunkwan University. Dr. Kim received his Ph.D. degree in Materials Science and Engineering from Korea Advanced Institute of Science and Technology (KAIST) in 2007. He then conducted his postdoctoral researches at Max Planck Institute of Microstructural Physics from 2008 to 2010 in Germany and at Oak Ridge National Laboratory from 2011 to 2012 in USA. In Sep. 2012, he joined Sungkyunkwan University as a faculty member. His current research interests include nanoscale characterization of electrical, electrochemical, and electromechanical systems using atomic force microscopy, data analysis using machine learning algorithms, and development of characterization techniques based on atomic force microscope and machine learning. So far he has published 177 papers in leading journals including Science, Energy & Environmental Science, Materials Science & Engineering R-Reports, Advanced Materials, etc. He serves as Director of Korean Society of Microscopy and committee of several other academic societies in Korea.